Surface analysis is used to characterize thin films and coatings and the surface properties of bulk materials. The elemental composition at the material interface (< 10 nm) can be quantitatively determined by X-ray photoelectron spectroscopy (XPS), where the bonding/oxidation state of the elements is also accessible. Layer thicknesses of thin films in the nanometer range can be determined by ellipsometry on reflective surfaces (e.g., gold or silicon wafers), while the wettability of surfaces with different liquid media can be evaluated by contact angle measurements. Surface roughness and topography is accessible by atomic force microscopy (AFM), as are surface elasticity, frictional and adhesive forces.
Devices, services and opportunities for cooperation
Showing results 1 - 6 out of 6
Kontaktwinkel- und Konturanalyse-Messsystem (Dataphysics OCA 15)
Stephan Peth (Head)
Soil Science SectionFacility/Equipment: Research Instrumentation
Contact person(s) for booking: Susanne Karoline Woche
E-Mail(s): wocheifbk.uni-hannover.de
XRD Fine-Structure X-Ray Diffractometer (Bruker D8 Advance) with in-situ measuring cell (Anton Paar HTK 1200N)
Armin Feldhoff (Head)
Institute of Physical Chemistry and ElectrochemistryFacility/Equipment: Research Instrumentation
Contact person(s) for booking: Armin Feldhoff
E-Mail(s): armin.feldhoffpci.uni-hannover.de
UV irradiation chamber Beltron BK 850 S
Marie Weinhart (Head)
Institute of Physical Chemistry and ElectrochemistryFacility/Equipment: Research Instrumentation
E-Mail(s): florian.tondockpci.uni-hannover.de
Spin Coater SPS SPIN150i-NPP
Marie Weinhart (Head)
Institute of Physical Chemistry and ElectrochemistryFacility/Equipment: Research Instrumentation
E-Mail(s): florian.tondockpci.uni-hannover.de
Rasterkraftmikroskop (Atomic Force Microscope) für biologische Anwendungen NanoWizard® 4 AFM mit Cellhesion (Bruker) und inversem AxioObserver3 Fluoreszenzmikroskop (Zeiss), Anschaffungsjahr 2019
Cornelia Lee-Thedieck (Head)
Institute of Cell Biology and BiophysicsFacility/Equipment: Major Research Instrumentation
Contact person(s) for booking: Peter Schertl
Kontaktwinkel- und Konturanalyse-Messsystem (dataphysics OCA 15EC)
Sebastian Polarz (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
