Surface analysis is used to characterize thin films and coatings and the surface properties of bulk materials. The elemental composition at the material interface (< 10 nm) can be quantitatively determined by X-ray photoelectron spectroscopy (XPS), where the bonding/oxidation state of the elements is also accessible. Layer thicknesses of thin films in the nanometer range can be determined by ellipsometry on reflective surfaces (e.g., gold or silicon wafers), while the wettability of surfaces with different liquid media can be evaluated by contact angle measurements. Surface roughness and topography is accessible by atomic force microscopy (AFM), as are surface elasticity, frictional and adhesive forces.
Devices, services and opportunities for cooperation
Showing results 1 - 14 out of 14
Kontaktwinkel- und Konturanalyse-Messsystem (dataphysics OCA 15EC)
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Micromeritics 3Flex
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Micromeritics TriStar II
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Quantachrome Autosorb-3
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
3P Vapor 100C
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Quantachrome Autosorb-1
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Quecksilberporosimetrie (Micromeritics AutoPore IV)
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Micromeritics ASAP 2020
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
Kontaktwinkel- und Konturanalyse-Messsystem (Dataphysics OCA 15)
Peth, S. (Head)
Soil Science SectionFacility/Equipment: Research Instrumentation
Contact person(s) for booking: Susanne Karoline Woche
E-Mail(s): wocheifbk.uni-hannover.de
Raster-Elektronenmikroskopie: Kalte-Feldemmision Raster Elektronenmikroskopie (Hitachi Regulus 8230)
Polarz, S. (Head)
Institute of Inorganic ChemistryFacility/Equipment: Research Instrumentation
E-Mail(s): stephan.sirokyaca.uni-hannover.de
XRD Fine-Structure X-Ray Diffractometer (Bruker D8 Advance) with in-situ measuring cell (Anton Paar HTK 1200N)
Feldhoff, A. (Head)
Institute of Physical Chemistry and ElectrochemistryFacility/Equipment: Research Instrumentation
Contact person(s) for booking: Armin Feldhoff
E-Mail(s): armin.feldhoffpci.uni-hannover.de
UV irradiation chamber Beltron BK 850 S
Weinhart, M. (Head)
Institute of Physical Chemistry and ElectrochemistryFacility/Equipment: Research Instrumentation
E-Mail(s): florian.tondockpci.uni-hannover.de
Spin Coater SPS SPIN150i-NPP
Weinhart, M. (Head)
Institute of Physical Chemistry and ElectrochemistryFacility/Equipment: Research Instrumentation
E-Mail(s): florian.tondockpci.uni-hannover.de
Rasterkraftmikroskop (Atomic Force Microscope) für biologische Anwendungen NanoWizard® 4 AFM mit Cellhesion (Bruker) und inversem AxioObserver3 Fluoreszenzmikroskop (Zeiss), Anschaffungsjahr 2019
Lee-Thedieck, C. (Head)
Institute of Cell Biology and BiophysicsFacility/Equipment: Major Research Instrumentation
Contact person(s) for booking: Peter Schertl
