Surface Analytics

Research unit | CoreNAT

Surface analysis is used to characterize thin films and coatings and the surface properties of bulk materials. The elemental composition at the material interface (< 10 nm) can be quantitatively determined by X-ray photoelectron spectroscopy (XPS), where the bonding/oxidation state of the elements is also accessible. Layer thicknesses of thin films in the nanometer range can be determined by ellipsometry on reflective surfaces (e.g., gold or silicon wafers), while the wettability of surfaces with different liquid media can be evaluated by contact angle measurements. Surface roughness and topography is accessible by atomic force microscopy (AFM), as are surface elasticity, frictional and adhesive forces.

Devices, services and opportunities for cooperation

Showing results 1 - 20 out of 20

Kontaktwinkel- und Konturanalyse-Messsystem (dataphysics OCA 15EC)

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Quantachrome Autosorb-1

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Micromeritics 3Flex

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Quantachrome Autosorb-3

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Micromeritics TriStar II

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

3P Vapor 100C

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Micromeritics ASAP 2020

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Quecksilberporosimetrie (Micromeritics AutoPore IV)

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Kontaktwinkel- und Konturanalyse-Messsystem (Dataphysics OCA 15)

Peth, S. (Head)

Soil Science Section

Facility/Equipment: Research Instrumentation

Contact person(s) for booking: Susanne Karoline Woche

E-Mail(s): wocheifbk.uni-hannover.de

Raster-Elektronenmikroskopie: Kalte-Feldemmision Raster Elektronenmikroskopie (Hitachi Regulus 8230)

Polarz, S. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Research Instrumentation

Mößbauer (Eigenbau mit MIMOS Detektoren. Messung in Transmission und Reflexion an festen Proben)

Renz, F. (Head)

Institute of Coordination Chemistry

Facility/Equipment: Research Instrumentation

Contact person(s) for booking: René Lucka

XRD Fine-Structure X-Ray Diffractometer (Bruker D8 Advance) with in-situ measuring cell (Anton Paar HTK 1200N)

Feldhoff, A. (Head)

Institute of Physical Chemistry and Electrochemistry

Facility/Equipment: Research Instrumentation

Contact person(s) for booking: Armin Feldhoff

E-Mail(s): armin.feldhoffpci.uni-hannover.de

Röntgenphotoelektronenspektroskopie (XPS):Kratos Axis Ultra DLD

Guggenberger, G. (Head)

Soil Science Section

Facility/Equipment: Research Instrumentation

Contact person(s) for booking: Leopold Sauheitl

E-Mail(s): sauheitlifbk.uni-hannover.de

UV irradiation chamber Beltron BK 850 S

Weinhart, M. (Head)

Institute of Physical Chemistry and Electrochemistry

Facility/Equipment: Research Instrumentation

Plasma oven (Zepto, Diener Electronic)

Weinhart, M. (Head)

Institute of Physical Chemistry and Electrochemistry

Facility/Equipment: Research Instrumentation

Spin Coater SPS SPIN150i-NPP

Weinhart, M. (Head)

Institute of Physical Chemistry and Electrochemistry

Facility/Equipment: Research Instrumentation

XPS X-Ray Photoelectron Spectrometer (PHI VersaProbe III, with UPS, Auger, Ar-Cluster-Beam etc.)

Schaate, A. (Head)

Institute of Inorganic Chemistry

Facility/Equipment: Major Research Instrumentation

Spectroscopic Ellipsometry (Sentech SENPro, Sentech)

Weinhart, M. (Head)

Institute of Physical Chemistry and Electrochemistry

Facility/Equipment: Research Instrumentation

Atomic force microscope for biological applications NanoWizard® 4 AFM with Cellhesion (Bruker) and inverse AxioObserver3 fluorescence microscope (Zeiss), year of acquisition 2019

Lee-Thedieck, C. (Head)

Institute of Cell Biology and Biophysics

Facility/Equipment: Major Research Instrumentation

Contact person(s) for booking: Peter Schertl

DataPhysics OCA 25 (Data Physics Instruments GmbH), contact angle analysis of surfaces to characterize their wetting properties as a function of surface composition

Weinhart, M. (Head)

Institute of Physical Chemistry and Electrochemistry

Facility/Equipment: Research Instrumentation

Terms of use and fee list

The terms of use define the rules for the services offered by the CoreNAT research infrastructure platform. Attached is a fee list for the use of large-scale equipment or profile-forming equipment or cooperation opportunities for the relevant CoreNAT research service or CoreNAT cooperation area. The price list applies to internal LUH facilities.
Separate contracts are concluded with external scientific or commercially orientated institutions, which regulate the details of the use of equipment and its costs.

 

Core Facility at the Faculty of Natural Sciences – bundles large-scale equipment, methods, and expertise for collaborative research projects.